Artificial Neural Network Discrimination for Parameter Estimation and Optimal Product Design of Thin Films Manufactured by Chemical Vapor Deposition
Source abstract
Abstract
Industrial production of valuable chemical products often involves the manipulation of phenomena evolving at different temporal and spatial scales. Product properties can be captured accurately using computationally expensive stochastic multiscale models that explicitly consider the feedbacks between different scales. However, product design quality is often tampered by uncertainties affecting process operation. In this work, we used artificial neural networks (ANNs) to estimate an uncertain parameter, accurately predict product properties under uncertainty, and achieve orders-of-magnitude computational savings of a multiscale model of thin film formation by chemical vapor deposition. ANNs were trained using multiple realizations of the uncertain parameter to capture the behavior of the thin film’s two key microscale properties: roughness and growth rate. Next, mean square error and maximum likelihood estimation were used for parameter estimation and to find the ANN that could generate the closest predictions to the real-time measurements collected from the process in the presence of uncertainty. The chosen ANNs were employed to seek for the optimal operating conditions to enable the fabrication process to meet product quality specifications. ANNs are a promising technique for product property prediction and efficient decision making in the design of optimal operating conditions for chemical processes under uncertainty.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Machine Learning in Materials Science · Injection Molding Process and Properties · Heat Transfer and Optimization
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Chemical Engineering, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
Funding
Government of Canada
References (100+)
Show source-provided references
1. 10.1016/j.compchemeng.2006.05.02510.1016/j.compchemeng.2006.05.025 ↗
2. Christofides P. D. · 200910.1007/978-0-8176-4793-3 ↗
3. 10.1016/j.ces.2010.06.00410.1016/j.ces.2010.06.004 ↗
4. 10.1016/S0895-7177(03)90013-610.1016/S0895-7177(03)90013-6 ↗
5. 10.1002/aic.1521510.1002/aic.15215 ↗
6. 10.1016/j.compchemeng.2018.08.01110.1016/j.compchemeng.2018.08.011 ↗
7. 10.1016/j.cherd.2019.05.04910.1016/j.cherd.2019.05.049 ↗
8. 10.1021/cs300011a10.1021/cs300011a ↗
9. 10.1021/cs200461t10.1021/cs200461t ↗
10. 10.1021/acscatal.5b0084010.1021/acscatal.5b00840 ↗
11. 10.1016/j.ces.2011.05.05010.1016/j.ces.2011.05.050 ↗
12. 10.1006/jcph.2000.647310.1006/jcph.2000.6473 ↗
13. 10.1016/j.ces.2015.02.02710.1016/j.ces.2015.02.027 ↗
14. 10.1016/j.ces.2013.12.00510.1016/j.ces.2013.12.005 ↗
15. 10.1016/j.ces.2014.07.05810.1016/j.ces.2014.07.058 ↗
16. 10.1002/aic.1403910.1002/aic.14039 ↗
17. 10.1016/j.jcat.2015.03.01010.1016/j.jcat.2015.03.010 ↗
18. 10.1016/j.renene.2016.06.06510.1016/j.renene.2016.06.065 ↗
19. 10.1016/j.ces.2011.08.02010.1016/j.ces.2011.08.020 ↗
20. 10.1002/aic.69043111510.1002/aic.690431115 ↗
21. 10.1103/PhysRevB.64.03540110.1103/PhysRevB.64.035401 ↗
22. 10.1016/S0065-2377(05)30001-910.1016/S0065-2377(05)30001-9 ↗
23. 10.1021/acs.iecr.5b0294210.1021/acs.iecr.5b02942 ↗
24. 10.1016/j.compchemeng.2018.03.01110.1016/j.compchemeng.2018.03.011 ↗
25. 10.1016/j.jcrysgro.2009.12.04110.1016/j.jcrysgro.2009.12.041 ↗
26. 10.3182/20100705-3-BE-2011.0014210.3182/20100705-3-BE-2011.00142 ↗
27. Bird R. B. · 2002
28. Schroeder D. V. · 2007
29. Frenkel D. · 2001
30. 10.1007/s10820-006-9042-910.1007/s10820-006-9042-9 ↗
31. 10.1016/j.cherd.2020.06.01710.1016/j.cherd.2020.06.017 ↗
32. 10.1016/j.ces.2014.05.02710.1016/j.ces.2014.05.027 ↗
33. 10.1016/j.ces.2015.10.00410.1016/j.ces.2015.10.004 ↗
34. 10.1016/j.jprocont.2015.07.00210.1016/j.jprocont.2015.07.002 ↗
35. 10.1016/j.compchemeng.2018.08.02910.1016/j.compchemeng.2018.08.029 ↗
36. Tran, A.; Sun, J.; Liu, D.; Wildey, T.; Wang, Y. Multiscale stochastic reduced-order model for uncertainty propagation using Fokker–Planck equation with microstructure evolution applications. arXiv (Computational Engineering, Finance, and Science), March 30, 2020, arXiv:2004.06487. https://arxiv.org/pdf/2004.06487.pdf.
37. 10.1557/mrc.2018.9310.1557/mrc.2018.93 ↗
38. 10.1137/11085316910.1137/110853169 ↗
39. 10.1063/1.480466910.1063/1.4804669 ↗
40. 10.1063/1.475726610.1063/1.4757266 ↗
41. 10.1016/j.ress.2010.11.01110.1016/j.ress.2010.11.011 ↗
42. 10.1146/annurev-matsci-071312-12170810.1146/annurev-matsci-071312-121708 ↗
43. 10.1002/aic.1570210.1002/aic.15702 ↗
44. 10.1002/aic.1626210.1002/aic.16262 ↗
45. 10.1016/j.ejor.2017.01.03510.1016/j.ejor.2017.01.035 ↗
46. 10.1016/j.ejor.2016.06.04110.1016/j.ejor.2016.06.041 ↗
47. 10.1007/s11071-016-2957-010.1007/s11071-016-2957-0 ↗
48. 10.1016/j.jprocont.2012.07.01110.1016/j.jprocont.2012.07.011 ↗
49. 10.1016/j.compchemeng.2018.08.01010.1016/j.compchemeng.2018.08.010 ↗
50. 10.1007/s00332-015-9258-510.1007/s00332-015-9258-5 ↗
51. 10.1016/j.compchemeng.2017.07.00210.1016/j.compchemeng.2017.07.002 ↗
52. 10.1016/j.jprocont.2020.05.00310.1016/j.jprocont.2020.05.003 ↗
53. Narasingam, A.; Kwon, J.S.I. Data-driven feedback stabilization of nonlinear systems: Koopman-based model predictive control. arXiv (Systems and Control), May 24, 2020, arXiv:2005.09741, version 2. https://arxiv.org/pdf/2005.09741.pdf.
54. Lu, Q.; Zavala, V. M. Image-Based Model Predictive Control via Dynamic Mode Decomposition. arXiv (Systems and Control), June 11, 2020, arXiv:2006.06727. https://arxiv.org/pdf/2006.06727.
55. 10.1016/j.compchemeng.2017.03.01110.1016/j.compchemeng.2017.03.011 ↗
56. 10.1016/S1570-7946(10)28215-910.1016/S1570-7946(10)28215-9 ↗
57. Solvason, C. C. Integrated Multiscale Chemical Product Design using Property Clustering and Decomposition Techniques in a Reverse Problem Formulation. Ph.D. Dissertation, Auburn University, Auburn, AL, 2011.
58. 10.1016/j.ress.2012.05.00210.1016/j.ress.2012.05.002 ↗
59. 10.3390/math611024210.3390/math6110242 ↗
60. 10.1016/j.cherd.2018.06.01510.1016/j.cherd.2018.06.015 ↗
61. 10.1021/acs.iecr.8b0593810.1021/acs.iecr.8b05938 ↗
62. 10.1016/j.ces.2015.02.00210.1016/j.ces.2015.02.002 ↗
63. 10.1166/jcsmd.2015.106910.1166/jcsmd.2015.1069 ↗
64. 10.1016/j.compchemeng.2017.05.02010.1016/j.compchemeng.2017.05.020 ↗
65. 10.1021/acs.iecr.7b0068210.1021/acs.iecr.7b00682 ↗
66. 10.1016/S0169-7439(97)00061-010.1016/S0169-7439(97)00061-0 ↗
67. Fausett L. · 1993
68. 10.1002/aic.1648910.1002/aic.16489 ↗
69. 10.1088/2515-7639/ab084b10.1088/2515-7639/ab084b ↗
70. 10.1038/s41586-018-0337-210.1038/s41586-018-0337-2 ↗
71. 10.1016/S0255-2701(02)00209-X10.1016/S0255-2701(02)00209-X ↗
72. 10.1016/j.envsoft.2006.03.00410.1016/j.envsoft.2006.03.004 ↗
73. 10.1016/S0009-2509(02)00432-310.1016/S0009-2509(02)00432-3 ↗
74. 10.1002/aic.69047061510.1002/aic.690470615 ↗
75. 10.1016/j.ces.2019.07.04410.1016/j.ces.2019.07.044 ↗
76. 10.1016/j.eswa.2010.08.07410.1016/j.eswa.2010.08.074 ↗
77. 10.1002/sia.531410.1002/sia.5314 ↗
78. 10.1109/66.57208310.1109/66.572083 ↗
79. 10.1109/TASE.2009.202367310.1109/TASE.2009.2023673 ↗
80. 10.1016/j.cherd.2018.10.00610.1016/j.cherd.2018.10.006 ↗
81. 10.1063/1.150642110.1063/1.1506421 ↗
82. 10.1103/PhysRevB.65.20530210.1103/PhysRevB.65.205302 ↗
83. 10.1103/PhysRevB.49.485810.1103/PhysRevB.49.4858 ↗
84. 10.1103/PhysRevB.56.772610.1103/PhysRevB.56.7726 ↗
85. 10.1103/PhysRevB.58.968510.1103/PhysRevB.58.9685 ↗
86. 10.1016/j.physa.2013.03.00710.1016/j.physa.2013.03.007 ↗
87. 10.1109/CDC.2004.142941910.1109/CDC.2004.1429419 ↗
88. 10.1016/B978-0-08-041275-7.50086-710.1016/B978-0-08-041275-7.50086-7 ↗
89. 10.1002/aic.69035121010.1002/aic.690351210 ↗
90. 10.1016/0893-6080(91)90009-T10.1016/0893-6080(91)90009-T ↗
91. 10.1007/BF0247825910.1007/BF02478259 ↗
92. 10.1021/ac00029a01810.1021/ac00029a018 ↗
93. 10.1016/0893-6080(90)90044-L10.1016/0893-6080(90)90044-L ↗
94. 10.1016/j.neunet.2009.10.00910.1016/j.neunet.2009.10.009 ↗
95. Lapedes A. · Proc. IEEE Inter. Conf. Neural Networks · 1987 · 5470451
96. 10.1109/78.84595010.1109/78.845950 ↗
97. 10.1109/TFSA.1996.54667510.1109/TFSA.1996.546675 ↗
98. Wen C. · Chinese J. Electron. · 2009 · 18 · 660
99. 10.1016/B978-0-08-047865-4.50012-010.1016/B978-0-08-047865-4.50012-0 ↗
100. 10.1016/j.ijleo.2013.10.05610.1016/j.ijleo.2013.10.056 ↗