From solid solutions to fully phase separated interpenetrating networks in sputter deposited “immiscible” W–Cu thin films
Source abstract
Abstract
Abstract W–Cu alloys are typically used for heat sinks, radiation shielding or high performance contact materials. Their immiscibility leads to interpenetrating structures, with typically smallest microstructural length scales on the order of several micrometres. This work focusses on tuning this length scale from the atomic level to the nanometre and submicron range. This is made possible by exploiting the two constituents’ immiscibility in thermodynamic equilibrium as well as the lack of Cu segregation to W grain-boundaries, thus allowing for the growth of the two phases. The system is studied in the complete concentration range and microstructure is related to both mechanical and electronic properties.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Metal and Thin Film Mechanics · Copper Interconnects and Reliability · Advanced materials and composites
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (65)
Show source-provided references
1. Martienssen · 2005
2. Tungsten alloys as radiation protection materials10.1016/S0168-9002(97)00392-6 ↗
3. J.G. Fleming, S.S. Mani, J.J. Sniegowski, R.S. Blewer, Tungsten coating for improved wear resistance and reliability of microelectromechanical devices, United States Patent No. 62908592001.
4. 2005
5. Assessment of tungsten for use in the ITER plasma facing components10.1016/S0022-3115(98)00285-2 ↗
6. Behaviors of full compositional W/Cu functionally gradient materials exposed to the edge plasma of HT-7 tokamak10.1016/j.jnucmat.2012.12.044 ↗
7. Recent progress in research on tungsten materials for nuclear fusion applications in Europe10.1016/j.jnucmat.2012.08.018 ↗
8. An experimental investigation on the W–Cu composites10.1016/j.matdes.2008.06.068 ↗
9. Stability of amorphous Cu/Ta and Cu/W alloys10.1063/1.335855 ↗
10. Synthesis of nanocrystalline copper–tungsten alloys by mechanical alloying10.1016/S0921-5093(00)01444-1 ↗
11. Heat of formation of alloys
12. Design of stable nanocrystalline alloys10.1126/science.1224737 ↗
13. Estimation of grain boundary segregation enthalpy and its role in stable nanocrystalline alloy design10.1557/jmr.2013.211 ↗
14. Stability of binary nanocrystalline alloys against grain growth and phase separation10.1016/j.actamat.2012.12.033 ↗
15. Sintering under plasma of a Ta–20%Cu composite powder prepared by high energy milling10.1016/j.ijrmhm.2007.05.004 ↗
16. Dilatometric analysis on the sintering behavior of nanocrystalline W–Cu prepared by mechanical alloying10.1016/S0925-8388(01)01805-9 ↗
17. Micro milling of sintered tungsten–copper composite materials10.1016/j.jmatprotec.2005.05.022 ↗
18. Tungsten–copper composite production by activated sintering and infiltration10.1016/j.ijrmhm.2011.03.009 ↗
19. The influence of the dispersion technique on the characteristics of the W–Cu powders and on the sintering behavior10.1016/S0032-5910(03)00123-2 ↗
20. Properties of W–Cu composite powder produced by a thermo-mechanical method10.1016/j.ijrmhm.2003.08.001 ↗
21. Preparation and characterization of W–Cu nanopowders by a homogeneous precipitation process10.1016/j.jallcom.2005.08.087 ↗
22. Morphology studies of a W/Cu alloy synthesized by hydrogen reduction10.1557/jmr.2006.0181 ↗
23. Metastable solid-solutions in vapor-deposited Cu–Cr, Cu–Mo, and Cu–W thin-films10.1116/1.572799 ↗
24. Nanocrystalline materials10.1179/imr.1995.40.2.41 ↗
25. Alpha- vs. beta-W nanocrystalline thin films: a comprehensive study of sputter parameters and resulting materials’ properties10.1016/j.tsf.2015.01.030 ↗
26. Williamson-Hall analysis in estimation of lattice strain in nanometer-sized ZnO particles10.1186/2251-7235-6-6 ↗
27. Bestimmung der Größe und der inneren Struktur von Kolloidteilchen mittels Röntgenstrahlen
28. The Scherrer equation versus the ‘Debye-Scherrer equation’10.1038/nnano.2011.145 ↗
29. Cullity · 2001
30. Quantitative interpretation of X-ray line broadening of plastically deformed crystals10.1107/S0021889875010060 ↗
31. Electron channeling contrast imaging of twins and dislocations in twinning-induced plasticity steels under controlled diffraction conditions in a scanning electron microscope10.1016/j.scriptamat.2009.06.018 ↗
32. Dislocation density measurement by electron channeling contrast imaging in a scanning electron microscope10.1016/j.scriptamat.2011.11.027 ↗
33. 3D visualization of dislocation arrangement using scanning electron microscope serial sectioning method10.1016/j.scriptamat.2015.02.001 ↗
34. An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments10.1557/JMR.1992.1564 ↗
35. A method of measuring specific resistivity and Hall effect of discs of arbitrary shape
36. Measurement of the resistivity of a thin square sample with a square four-probe array10.1016/0038-1101(77)90130-7 ↗
37. Cone formation on metal targets during sputtering10.1063/1.1660158 ↗
38. JCPDS, PDF 00-004-0836, in: PDF 00-004-0836, International Centre for Diffraction Data ICDD, 2004.
39. JCPDS, PDF 00-004-0806, in: PDF 00-004-0806, International Centre for Diffraction Data ICDD, 2004.
40. Geometrical percolation threshold of overlapping ellipsoids10.1103/PhysRevE.52.819 ↗
41. Percolation, statistical topography, and transport in random media10.1103/RevModPhys.64.961 ↗
42. C.M. Müller, Phase separation in co-sputtered immiscible Cu-Ta alloy films, Department of Materials (Ph.D. thesis), 2014.
43. Metastable crystalline and amorphous structures formed in the Cu–W system by vapor deposition10.1007/BF02657233 ↗
44. Comparative study of metastable phase formation in the immiscible Cu–W system by ab initio calculation and n-body potential
45. Electronic-structure of amorphous and disordered crystalline Cu–W alloys of similar composition10.1016/0038-1098(90)90220-6 ↗
46. Crystallization of Cu50W50 and Cu66W34 amorphous alloys10.1016/0022-3093(94)90109-0 ↗
47. Preparation and structure of Cu–W thin-films10.1016/0040-6090(93)90604-N ↗
48. Peak broadening and peak shift pole figures investigations by STRESS-SPEC diffractometer at FRM II
49. Lifshitz-Slyozov kinetics of a nonconserved system that separates into phases of different density10.1103/PhysRevB.42.4506 ↗
50. Temperature and composition dependence of kinetics of phase separation in solid binary mixtures10.1039/c3cp50612f ↗
51. Theory of nucleation and growth during phase separation10.1103/PhysRevE.59.4175 ↗
52. Structure and phase separation of Ag–Cu alloy thin films10.1016/j.actamat.2006.10.036 ↗
53. Nanoindentation studies of Cu–W alloy films prepared by magnetron sputtering10.1016/j.jallcom.2007.10.033 ↗
54. Microhardness properties of Cu–W amorphous thin films10.1023/A:1013201817300 ↗
55. Ueber die elektrische Leitungsfähigkeit der Legirungen10.1002/andp.18601860603 ↗
56. Ueber den Einfluss der Temperatur auf die elektrische Leitungsfähigkeit der Legirungen10.1002/andp.18641980504 ↗
57. The conductivity of thin metallic films according to the electron theory of metals10.1017/S0305004100019952 ↗
58. The mean free path of electrons in metals10.1080/00018735200101151 ↗
59. Electrical resistivity model for polycrystalline films: the case of specular reflection at external surfaces10.1063/1.1652680 ↗
60. Surface and grain boundary scattering studied in beveled polycrystalline thin copper films10.1116/1.1771666 ↗
61. Influence of the electron mean free path on the resistivity of thin metal films10.1016/j.mee.2004.07.041 ↗
62. Electron mean free path of tungsten and the electrical resistivity of epitaxial (110) tungsten films10.1103/PhysRevB.86.045432 ↗
63. Electrical-resistivity model for polycrystalline films: The case of arbitrary reflection at external surfaces10.1103/PhysRevB.1.1382 ↗
64. Production of tungsten alloy penetration radiation shields10.1179/pom.1967.10.20.006 ↗
65. On spinodal decomposition in Cu–34 at.% Ta thin films – an atom probe tomography and transmission electron microscopy study10.1016/j.actamat.2015.01.073 ↗