Coupling between Re segregation and γ/γ′ interfacial dislocations during high-temperature, low-stress creep of a nickel-based single-crystal superalloy
Source abstract
Abstract
Abstract The synergistic action of local elemental distribution, and in particular Re doping, with interfacial dislocations at the γ/γ′ interface is still one of the most considered and unclear issues during creep of nickel-based single-crystal superalloys. In order to investigate this problem, a detailed characterization of interfacial dislocations in a DD6 superalloy after creep loading for 12 h at high temperature and low stress was carried out using transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy techniques. In addition, the local elemental distribution near dislocation core regions was determined by energy dispersive X-ray spectroscopy (EDS) mapping. It was found for the first time that three types of interfacial protrusions are formed at the γ/γ′ interface after creep loading for 12 h under conditions of high temperature and low stress and demonstrated that the formation of these features originates from dislocation motion. Additionally, EDS mapping provides evidence for co-segregation of Re with Cr and Co at the tip of the protrusions. Based on this, a model concerning dislocation core structure and dislocation climb was proposed to explain the different morphology of the protrusions. The observations highlight the importance of the coupling between Re segregation and γ/γ′ interfacial dislocations for improving creep properties in nickel-based superalloys. The results of the study will be beneficial for the design of new high-temperature materials and for understanding the origin of the effect of Re additions in nickel-based single-crystal superalloys.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: High Temperature Alloys and Creep · Advanced Materials Characterization Techniques · High-Temperature Coating Behaviors
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (30)
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