journal article·1979-12

The application of secondary ion emission to impurity control in tokamaks

A.R. Krauss, D.M. Gruen

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Ion-surface interactions and analysis · Fusion materials and technologies · Metal and Thin Film Mechanics

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References (37)

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