Stable lattice thermal expansion of ZIRLO™: High-temperature X-ray diffraction results
Source abstract
Abstract
Abstract Crystallographic properties of Zr and ZIRLO™ in the temperature range of 30–1430 °C were investigated using in situ high-temperature X-ray diffraction (HT-XRD). Hexagonal Zr diffraction peaks observed at 30 °C started to vanish above 1110 °C for Zr and 1230 °C for ZIRLO™ owing to oxidation, resulting in a composition with monoclinic ZrO2, tetragonal ZrO2, and rhombohedral Zr3O. Furthermore, based on Pawley refinement of in situ HT-XRD spectra, we demonstrated that the lattice thermal expansion in ZIRLO™ occurred in a stable manner compared to that in Zr, which contribute to the enhancement of its mechanical properties via thermal treatment.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Nuclear Materials and Properties · Advanced ceramic materials synthesis · Advancements in Solid Oxide Fuel Cells
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (30)
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