journal article·1981-01

Characterization of TiB2 coated layer by X-ray lattice constant measurement

Isao Yoshizawa, Ryoichi Urao, Yoichiro Hori, Kenya Akaishi, Kohji Kamada

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Metal and Thin Film Mechanics · Fusion materials and technologies · Silicon Carbide Semiconductor Technologies

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References (15)

Show source-provided references
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7. Elastic constants of Tic and TiB210.1063/1.1736249 ↗
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11. Thermophysical Properties of Matter, TPRC Data Series · 1977 · Vol. 13 · 715
12. Trent · 1959
13. Intrinsic stresses of magnetronsputtered Nb films10.1016/0040-6090(79)90549-2 ↗
14. Internal stresses in metallic films deposited by cylindrical magnetron sputtering10.1016/0040-6090(79)90550-9 ↗
15. Cullity · 1957