Deuterium retention on He-irradiated F82H with surface impurity layer

Abstract The deuterium retention/desorption behavior of F82H has been studied to clarify the effect of radiation damage with respect to the impurity layer. To evaluate the effects of oxygen impurities, non-oxidized and thermally oxidized samples were prepared with the introduction of radiation damage through He + irradiation. The amount of deuterium retained in the thermally oxidized samples was less than that of the non-oxidized samples. The amount of deuterium retained in the oxidized sample increased after He + irradiation. The retention/desorption behaviors were discussed in the surface chemical state.