journal article·1992-12

Measurements of secondary electron emission for fusion related materials

J.M. Pedgley, G.M. McCracken, H. Farhang, B.H. Blott

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Plasma Diagnostics and Applications · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (12)

Show source-provided references
1. Stangeby · 1986 · vol. 131 · 41
2. Woods · J. Phys. · 1987 · D20 · 1136
3. Matthews · J. Nucl. Mater. · 1987 · 145–147 · 22510.1016/0022-3115(87)90332-1 ↗
4. Particle induced electron emission I
5. V.G. Microtech, Type AG21.
6. Woods · Surf. Sci. · 1985 · 162 · 92910.1016/0039-6028(85)91000-3 ↗
7. Ruzic · J. Vac. Sci. Techol. · 1982 · 20 · 131310.1116/1.571569 ↗
8. Bruining · 1954
9. Ohya · Jpn. J. Appl. Phys. · 1991 · 30 · 109310.1143/JJAP.30.1093 ↗
10. Ohya · J. Nucl. Mater. · 1990 · 176 & 177 · 88310.1016/0022-3115(90)90162-G ↗
11. Staudenmaier · J. Nucl. Mater. · 1979 · 84 · 14910.1016/0022-3115(79)90158-2 ↗
12. Cohen · J. Nucl. Mater. · 1979 · 84 · 15710.1016/0022-3115(79)90159-4 ↗