journal article·1992-09

In-situ observation of damage evolution in SiC crystals during He+ and H2+ dual-ion beam irradiation

K. Hojou, S. Furuno, K.N. Kushita, H. Otsu, K. Izui

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Ion-surface interactions and analysis · Silicon and Solar Cell Technologies · Silicon Carbide Semiconductor Technologies

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References (8)

Show source-provided references
1. Ishino · IEEE Trans. Nucl. Sci. · 1983 · NS-30 · 125510.1109/TNS.1983.4332503 ↗
2. Takeyama · J. Nucl. Mater. · 1985 · 133 & 134 · 57110.1016/0022-3115(85)90212-0 ↗
3. Hojou · J. Nucl. Mater. · 1988 · 155–157 · 29810.1016/0022-3115(88)90258-9 ↗
4. Hojou · J. Nucl, Mater. · 1988 · 160 · 14710.1016/0022-3115(88)90042-6 ↗
5. Hojou · J. Electron Microsc. · 1991 · 40 · 157
6. Hojou · J. Nucl. Mater. · 1991 · 179–181 · 41110.1016/0022-3115(91)90112-K ↗
7. Furuno · 1990 · vol. 4 · 538
8. Furuno · J. Electron Microsc. · 1992 · 41