He+ ion energy loss parameter in thin films of UO2
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Research context
OpenAlex topics: Ion-surface interactions and analysis · Radiation Detection and Scintillator Technologies · Semiconductor materials and devices
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References (5)
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2. Nasu · J. Nucl. Mater. · 1972 · 42 · 30710.1016/0022-3115(72)90081-5 ↗
3. Nasu · J. Nucl. Mater. · 1974 · 54 · 14310.1016/0022-3115(74)90086-5 ↗
4. Borders · Rad. Effects · 1972 · 16 · 25310.1080/00337577208231227 ↗
5. New Uses of Ion Accelerators