Radiation damage of α-Al2O3 in the HVEM
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Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis · Ion-surface interactions and analysis
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References (14)
Show source-provided references
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14. Hobbs · 1973 · A332 · 167