A solution to FIB induced artefact hydrides in Zr alloys
Source abstract
Abstract
Abstract The preparation of TEM samples using focused-ion beam (FIB) techniques allows for characterization of electron-transparent site-specific areas, such as oxide-metal interfaces and crack tips, leading to improved understanding of material degradation mechanisms. Using conventional FIB techniques to prepare zirconium alloy TEM samples results in the production of artefact δ hydrides during the final thinning stage, which can confound analyses and mechanistic interpretation, especially when understanding hydride morphology and crystallography is critical. A comparison of various preparation methods was performed to determine their influence on artefact hydrides in TEM samples. As-received Zircaloy-4 material with
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Research context
OpenAlex topics: Nuclear Materials and Properties · Fusion materials and technologies · Hydrogen embrittlement and corrosion behaviors in metals
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