Improved DSPI configuration for the inspection of components in the production line
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Abstract
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OpenAlex topics: Industrial Vision Systems and Defect Detection · Manufacturing Process and Optimization · Advanced Measurement and Metrology Techniques
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References (8)
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8. J. B. Deaton, Jr. and R. S. Rogowski, A compact Michelson based shearography and ESPI system for nondestructive evaluation.Rev. Prog. Quant. NDE 13:373?380 (1994).