journal article·1984-12

Flaw detection close to the interface using ultrasonic echography

R. Lengelle, P. Gaillard, J. F. de Belleval

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Ultrasonics and Acoustic Wave Propagation · Non-Destructive Testing Techniques · Structural Health Monitoring Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (4)

Show source-provided references
1. C. A. Mercer, Development of data analysis in sound and vibration,Journal of Sound and Vibration 28(3):631?642, (1973).10.1016/S0022-460X(73)80043-4 ↗
2. A. V. Oppenheim, R. W. Schafer, and T. G. Stockham, Jr., Non linear filtering of multiplied and convolved signals,Proc. IEEE 56:(8) (Aug. 1968).10.1109/PROC.1968.6570 ↗
3. A. N. Mucciardi and R. Shankar, Near-surface defect detection,Materials Evaluation 39:74?77 (1979).
4. R. Lengelle,Amélioration de la Résolution pour l'interface en échographie Ultrasonore par les Techniques de Traitement de Signal, (Université de Technologie de Compiègne, Sept. 1983).