journal article·1984-12

Analytical solution for impedance change due to flaws in eddy current testing

Jae-yel Yi, Sekyung Lee

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Non-Destructive Testing Techniques · Welding Techniques and Residual Stresses · Electrical Fault Detection and Protection

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (3)

Show source-provided references
1. B. A. Auld, F. Muennemann, and D. K. Winslow,J. Nondestr. Eval. 2:1 (1981).10.1007/BF00614993 ↗
2. Afroz J. M. Zaman, C. G. Gardner, and S. A. Long,J. Nondestr. Eval. 3:37 (1982).10.1007/BF00566953 ↗
3. C. V. Dodd and W. E. Deeds,J. Appl. Phys. 39:2829 (1968).10.1063/1.1656680 ↗