journal article·2014-09

Post-Processing of Phased-Array Ultrasonic Inspection Data with Parallel Computing for Nondestructive Evaluation

Xuefei Guan, Jingdan Zhang, S. Kevin Zhou, El Mahjoub Rasselkorde, Waheed A. Abbasi

Publisher page

Abstract

Phased-array ultrasonic nondestructive evaluation is an effective tool of safety assurance for key structural components. The paper presents a general post-processing methodology for phased-array ultrasonic inspection data. The methodology is developed to integrate three components: mapping of sampling points to structure model, re-sampling from non-uniformly distributed sampling points in phased-array to a uniform volume, and data fusion strategies for multiple channels. An adaptive method called spatially adaptive Gaussian splatting is proposed for data re-sampling and fusion considering the reconstruction resolution and local characteristics of ultrasonic sound paths. This adaptivity provides a viable approach to minimize the effects of under-sampling, over-sampling, and holes which are introduced by the non-uniformly distributed sampling points. The processing of large scale data through segmentation and parallelization techniques is discussed in detail. The effectiveness and performance of the proposed methodology are investigated using actual phased-array ultrasonic testing data.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Ultrasonics and Acoustic Wave Propagation · Flow Measurement and Analysis · Non-Destructive Testing Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (25)

Show source-provided references
1. Drinkwater, B., Wilcox, P.: Nondestruct. Test. Eval. Int. 39(7), 525 (2006)
2. Wylie, N., Wylie, S., Cullen, J., Al-Jader, M., Al-Shamma’a, A., Shaw, A.: In: Sensors Applications Symposium (SAS), 2010 IEEE, pp. 73–78. IEEE Press, New York (2010)
3. Bachschmid, N., Pennacchi, P., Tanzi, E.: In: Cracked Rotors, pp. 37–90. Springer, Berlin (2010)10.1007/978-3-642-01485-7_3 ↗
4. Lane, C., Dunhill, T., Drinkwater, B., Wilcox, P.: Insight 52(2), 72 (2010)10.1784/insi.2010.52.2.72 ↗
5. Guan, X., Zhang, J., Zhou, S., Rasselkorde, E.M., Abbasi, W.: NDT & E Int. 61, 1 (2014)10.1016/j.ndteint.2013.09.003 ↗
6. Liu, Z., Forsyth, D.S., Komorowski, J.P., Hanasaki, K., Kirubarajan, T.: IEEE Trans. Instrum. Meas. 56(6), 2435 (2007)10.1109/TIM.2007.908139 ↗
7. Bulavinov, A., Pinchuk, R., Pudovikov, S., Reddy, K., Walte, F.: In: European Conference for Nondestructive Testing, Moscow, vol. 1 (2010)
8. Chatillon, S., Cattiaux, G., Serre, M., Roy, O.: Ultrasonics 38(1), 131 (2000)10.1016/S0041-624X(99)00181-X ↗
9. Liao, S.H.: Expert Syst. Appl. 28(1), 93 (2005)10.1016/j.eswa.2004.08.003 ↗
10. Yonetsiji, E., Murakami, T., Braconnier, D.: In: Proceedings of the 9th European Conference on NDT, DGZfP, Berlin, vol. 103-CD, (2006). We. 1.2.2
11. Spies, M., Rieder, H., Didion, C., Santraine, B., Licht, R., Gebhardt, W.: In: Proceedings of the 9th European Conference on NDT, DGZfP, Berlin, vol. 103-CD (2006). Fr. 1.1.3
12. Cornwell, I., McNab, A.: Nondestruct. Test. Eval. Int. 32(2), 101 (1999)
13. McNab, A., Reilly, D., Potts, A., Toft, M.: In: Science, Measurement and Technology, IEE Proceedings, vol. 148, pp. 149–158. IET, London (2001)
14. Nagamune, K., Hata, Y., Taniguchi, K.: In: 5th International Conference on Signal Processing Proceedings, 2000. WCCC-ICSP 2000, vol. 2, pp. 877–881. IEEE Press, New York (2000)
15. Calmon, P., Iakovleva, E., Fidahoussen, A., Ribay, G., Chatillon, S.: In: AIP Conference Proceedings, vol. 975, p. 699 (2008)10.1063/1.2902730 ↗
16. Bernus, L.V., Bulavinov, A., Dalichow, M., Joneit, D., Kröning, M., Reddy, K.: Insight 48(9), 545 (2006)10.1784/insi.2006.48.9.545 ↗
17. Xiao, K., Wang, Q., Hu, D.: Proc. Eng. 43, 419 (2012)10.1016/j.proeng.2012.08.072 ↗
18. Wedgwood, F.: In: IEE Colloquium on Digital Signal Processing and Display Techniques for Ultrasonics, pp. 1–11. IET, London (1988)
19. Westover, L.: In: Proceedings of the 1989 Chapel Hill Workshop on Volume Visualization, pp. 9–16. ACM, New York (1989)10.1145/329129.329138 ↗
20. Westover, L.: Comput. Graph. 24(4), 367 (1990)10.1145/97880.97919 ↗
21. Mao, X.: IEEE Trans. Vis. Comput. Graph. 2(2), 156 (1996)10.1109/2945.506227 ↗
22. Mao, X., Hong, L., Kaufman, A.: In: Proceedings of the 6th Conference on Visualization’95, p. 61. IEEE Comput. Soc., Los Alamitos (1995)
23. Zwicker, M., Pfister, H., van Baar, J., Gross, M.: In: Visualization, 2001. VIS’01. Proceedings, pp. 29–538. IEEE Press, New York (2001)10.1109/VISUAL.2001.964490 ↗
24. Zwicker, M., Pfister, H., Van Baar, J., Gross, M.: IEEE Trans. Vis. Comput. Graph. 8(3), 223 (2002)10.1109/TVCG.2002.1021576 ↗
25. Greene, N., Heckbert, P.: IEEE Comput. Graph. Appl. 6(6), 21 (1986)10.1109/MCG.1986.276738 ↗