journal article·2025-10

Controlling the valence change of sulfur in glass during S K-edge XAFS measurements by conductive coating

Yoshitaka Saijo, Saki Ozawa, Tatsuya Miyajima, Shinta Watanabe, Hiroyuki Hijiya, Kakeru Ninomiya, Maiko Nishibori

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OpenAlex topics: X-ray Spectroscopy and Fluorescence Analysis · Glass properties and applications · X-ray Diffraction in Crystallography

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