journal article·2000-05

Temperature dependence of photoluminescence intensity and decay in GeSe2 glass

Osamu Matsuda, Kosaku Yamagata, Yuichi Saitoh, Yong Wang, Koichi Inoue, Kazuo Murase

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Abstract

Abstract The intensity and decay profile of the photoluminescence (PL) in glassy GeSe2 are measured as a function of temperature from 2 to 200 K. The intensity decreases exponentially in the temperature region >100 K. The complicated temperature dependence of the decay profile as well as the dependence of the intensity are explained in a unified framework by adopting a model of the luminescent sites whose thermal activation energy for the non-radiative process is distributed. We show that the intensity variation is affected by the non-radiative process while the decay life time depends almost only on the radiative transition rate.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Phase-change materials and chalcogenides · Glass properties and applications · Thin-Film Transistor Technologies

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References (5)

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