Atom-probe field-ion microscope study of amorphous structure: Markov chain analysis
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Diamond and Carbon-based Materials Research · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (12)
Show source-provided references
1. Wagner · 1982
2. Miller · Int. Materials Reviews · 1987 · 32 · 22110.1179/imr.1987.32.1.221 ↗
3. Hetherington · J. de Physique · 1987 · C6 · 559
4. Johnson · Technometrics · 1974 · 16 · 48310.1080/00401706.1974.10489229 ↗
5. Tsong · J. Appl. Phys. · 1982 · 53 · 418010.1063/1.331241 ↗
6. Wang · Surface Sci. · 1988 · 197 · 32710.1016/0039-6028(88)90588-2 ↗
7. Freedman · 1971
8. Kemeny · 1976
9. Ohnaka · 1981 · 31
10. Yamamoto · Tech. Rept. Osaka Univ. · 1983 · Vol. 33 · 257
11. Yamamoto · J. de Phys. · 1987 · C6 · 367
12. Yamamoto · J. de Phys. · 1987 · C6 · 311