The built-in fields and interfacial properties of a-Si:H/a-SiN :H multilayers studied by electroabsorption spectroscopy
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OpenAlex topics: Semiconductor materials and devices · Semiconductor materials and interfaces · Silicon Nanostructures and Photoluminescence
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References (11)
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1. Franz · Z. Naturf. · 1958 · 134 · 48410.1515/zna-1958-0609 ↗
2. Keldysh · Zh. Eksp. Teor. Fiz. · 1958 · 34 · 962
3. Sov. Phs. JETP · 1958 · 34 · 788
4. Roxlo · Phys. Rev. Lett. · 1984 · 52 · 199410.1103/PhysRevLett.52.1994 ↗
5. Roxlo · Phys. Rev. B · 1986 · 34 · 252210.1103/PhysRevB.34.2522 ↗
6. Hamakawa · 1984 · Vol. 21 · 151
7. Hattori · Appl. Phys. Lett. · 1989 · 55 · 76310.1063/1.101799 ↗
8. Weiser · J. of Non-Cryst. Solids · 1989 · 114 · 25010.1016/0022-3093(89)90127-0 ↗
9. Street · Appl. Phys. Lett. · 1984 · 45 · 76910.1063/1.95398 ↗
10. Liu · J. of Non-Cryst. Solids · 1989 · 114 · 73810.1016/0022-3093(89)90705-9 ↗
11. Introduction to Solid State Physics