Hole trapping in flash EEPROM gate oxide and damages induced by gate to source erasing
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Research context
OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Integrated Circuits and Semiconductor Failure Analysis
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References (11)
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10. San · IEEE Electron Dev. Lett. · 1992 · 13 · 43910.1109/55.192784 ↗
11. Bez · 1990 · 99