Field-effect problems with I-V measurements on gap-type a-Si:H specimens
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OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Integrated Circuits and Semiconductor Failure Analysis
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References (2)
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1. Spear · J. Non-Crystall. Solids · 1972 · 8–10 · 72710.1016/0022-3093(72)90220-7 ↗
2. Fritzsche · J. Non-Crystall. Solids · 1985 · 77–78 · 27310.1016/0022-3093(85)90656-8 ↗