journal article·2000-11

Rapid relaxation and electronic properties of a-Si:H

Wen Chao Chen, Mathieu Kemp, Louis-André Hamel, Arthur Yelon

Journal of Non-Crystalline Solids· Volume 277· Issue 2-3
Publisher page

Abstract

We analyze the impact of trapped carrier relaxation on the determination of the microscopic electronic mobility of a-Si:H. The calculations show that, if there is relaxation, the mobility is substantially higher than that predicted by the standard multiple trapping picture. This model therefore explains the absence of room temperature geminate recombination (GR) in a-Si:H, and is consistent with both time-of-flight (TOF) and photoluminescence (PL) experiments. That is, we may understand three experimental results which have long appeared to be contradictory, in the framework of a single, simple model.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Silicon and Solar Cell Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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