Dangling bond as a variable-U defect in a-Si:H
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Abstract
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Research context
OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · CCD and CMOS Imaging Sensors
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References (13)
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1. Vanier · J. Appl. Phys. · 1981 · 52 · 523510.1063/1.329427 ↗
2. Gu · Phil. Mag. · 1986 · B53 · 32110.1080/01418638608244291 ↗
3. Zvyagin · JETP Lett. · 1986 · 43 · 528
4. Kurova · J. Non-Cryst. Sol. · 1987 · 90 · 20710.1016/S0022-3093(87)80415-5 ↗
5. Fritzsche · J. Non-Cryst. Sol. · 1985 · 77–78 · 27310.1016/0022-3093(85)90656-8 ↗
6. Zvyagin · 1984
7. Staebler · Appl. Phys. Lett. · 1977 · 31 · 29210.1063/1.89674 ↗
8. Irsigler · J. Phys. · 1983 · C16 · 6605
9. Overhof · Phil. Mag. · 1983 · B47 · 37710.1080/13642812.1983.10590676 ↗
10. Yoon · J. Appl. Phys. · 1986 · 57 · 3943
11. Zvyagin · 1987
12. Street · Phys. Rev. Lett. · 1982 · 49 · 118710.1103/PhysRevLett.49.1187 ↗
13. Stutzmann · Phil. Mag. · 1986 · B53 · L13