Critical percolation thickness of deposited metal films
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Theoretical and Computational Physics · Stochastic processes and statistical mechanics · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (12)
Show source-provided references
1. Smith · Phys. Rev. · 1979 · B20 · 365310.1103/PhysRevB.20.3653 ↗
2. Voss · Phys. Rev. Lett. · 1982 · 49 · 144110.1103/PhysRevLett.49.1441 ↗
3. Kapitulnik · Phys. Rev. Lett. · 1982 · 49 · 144410.1103/PhysRevLett.49.1444 ↗
4. Voss · 1983 · 153
5. Nakamura · J. Appl. Phys. · 1984 · 56 · 80610.1063/1.334011 ↗
6. Nakamura · J. Appl. Phys. · 1985 · 58 · 349910.1063/1.335774 ↗
7. Nakamura · Phys. Rev. · 1986 · A34 · 335610.1103/PhysRevA.34.3356 ↗
8. Nakamura · Phys. Rev. · 1987 · 36 · 238410.1103/PhysRevA.36.2384 ↗
9. Nakamura · Z. Phys. Chem. · 1988 · 156 · 22510.1524/zpch.1988.156.Part_1.225 ↗
10. Octavio · Phys. Rev. · 1987 · B36 · 246110.1103/PhysRevB.36.2461 ↗
11. Yonezawa · Phys. Rev. · 1989 · B40 · 63610.1103/PhysRevB.40.636 ↗
12. Mandelbrot · 1983