Intrinsic type a-SiC:H hole-blocking layer effects on image lag in an amorphous silicon image sensor
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OpenAlex topics: Thin-Film Transistor Technologies · High voltage insulation and dielectric phenomena · CCD and CMOS Imaging Sensors
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References (3)
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1. Manabe · IEEE ISSCC, Digest of Technical Papers · 1988 · 50
2. Nozaki · IEEE Transaction of Electron Devices · 1989 · Vol. 36 · 281010.1109/16.40942 ↗
3. Miyagaki · 1990 · Vol. 192 · 427