Simulation of the effects of capture rates and the band mobility on transient currents in a-Si:H pin devices
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OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Integrated Circuits and Semiconductor Failure Analysis
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References (9)
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2. Silver · Phil. Mag. B · 1986 · 53 · L8910.1080/01418638608244285 ↗
3. Physics of Amorphous Semiconductor Devices
4. Charge defects in a-Si:H alloys: Are they the answer?
5. Silver · J. Non-Cryst. Sol. · 1987 · 97&98 · 30510.1016/0022-3093(87)90073-1 ↗
6. Current-Voltage Characteristics—What Do Experiments Really Tell Us?
7. Shapiro · 1988
8. F.R. Shapiro, Y. Bar-Yam, and M. Silver, IEEE Trans. Elect. Dev., in press.
9. Shapiro · J. Appl. Phys. · 1988 · 64 · 218510.1063/1.341705 ↗