IR and RBS studies of RF sputtered films of vanadium doped silicon dioxide
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Abstract
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Research context
OpenAlex topics: Semiconductor materials and devices · Transition Metal Oxide Nanomaterials · Thin-Film Transistor Technologies
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References (6)
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1. Krishna · Physica · 1985 · B129 · 245
2. Krishna · 1985 · 1321
3. DeLima · Phil. Mag. · 1986 · B53 · 11510.1080/13642818608238979 ↗
4. Pliskin · J. Vac. Sci. Technol. · 1977 · 14 · 106410.1116/1.569413 ↗
5. Ritter · Opt. Acta · 1962 · 9 · 19710.1080/713826414 ↗
6. Dachille · J. Amer. Ceram. Soc. · 1965 · 42 · 7810.1111/j.1151-2916.1959.tb14070.x ↗