Amorphous hydrogenated silicon inhomogeneities as revealed by scanning with mercury and laser probes
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Surface Roughness and Optical Measurements · Silicon and Solar Cell Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
1. 1984
2. Nakhmanson · Thin Solid Films · 1978 · 55 · 16910.1016/0040-6090(78)90046-9 ↗
3. Roizin · Thin Solid Films · 1991 · 68
4. Nakhmanson · 1975 · 5 · 77
5. Endrichovsky · Fiz.Tekh.Poluprovodn. · 1989 · 23 · 444
6. Qin · Sol.St.Comm. · 1989 · 71 · 4510.1016/0038-1098(89)90168-3 ↗
7. Andrianova · Photoelectronica · 1990 · 4