journal article·1989-12

In situ electron spin resonance measurements of thermally induced metastable defects in doped hydrogenated amorphous silicon carbon films

Deyan He, Fangqing Zhang, Wei Chen, Guanghua Chen

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Diamond and Carbon-based Materials Research · Magneto-Optical Properties and Applications

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References (3)

Show source-provided references
1. Smith · Phys. Rev. · 1985 · B32 · 551010.1103/PhysRevB.32.5510 ↗
2. Street · Phys. Rev. · 1987 · B35 · 131610.1103/PhysRevB.35.1316 ↗
3. Xu · Phys. Rev. · 1988 · B38 · 837110.1103/PhysRevB.38.8371 ↗