Study of hot carrier degradation in dram cells combining random telegraph signal and charge pumping measurements
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (15)
Show source-provided references
1. J.L. Autran, B. Balland, G. Barbottin, in: G. Barbottin, A. Vapaille (Eds.), Instabilities in Silicon Devices – Silicon Passivation and Related Instabilities, North-Holland, Elsevier Science, Amsterdam, vol. 3, chapter 6, 1999, in press
2. Groeseneken · IEEE Trans. Electron Devices · 1996 · 43 · 94010.1109/16.502127 ↗
3. Saks · Appl. Phys. Lett. · 1996 · 68 · 138310.1063/1.116087 ↗
4. Pierunek · Microelectron. Eng. · 1997 · 36 · 8310.1016/S0167-9317(97)00020-8 ↗
5. Kirton · Adv. Phys. · 1989 · 38 · 36710.1080/00018738900101122 ↗
6. Schulz · Appl. Phys. · 1991 · A 52 · 10410.1007/BF00323724 ↗
7. M. Shulz, A. Pappas, J. Vennemann, in: C.R. Helms, B.E. Deal (Eds.), The Physics and Chemistry of SiO2 and Its Interface to Silicon, Plenum, NY, 1993
8. Ralls · Phys. Rev. Lett. · 1984 · 52 · 22810.1103/PhysRevLett.52.228 ↗
9. Autran · Solid-State Electron. · 1996 · 39 · 139410.1016/0038-1101(96)00039-1 ↗
10. MEDICI™, Two-dimensional device simulation program, version 2.2, Technology Modeling Associates, Inc. (CA), 1996
11. Simoen · Microelectron. Eng. · 1992 · 19 · 60510.1016/0167-9317(92)90506-M ↗
12. D.H. Cobden, M.J. Uren, in: P. Balk (Ed.), Proceedings of the International Conference on Insulating Films on Semiconductors INFOS'93, Delft, The Netherlands, Elsevier Science, Amsterdam, 1993, 163
13. O. Roux-dit-Buisson, PhD thesis, Institut National Polytechnique de Grenoble, 1993
14. G. Ghibaudo, O. Roux-dit-Buisson, Proc. ESSDERC 94
15. McWorther · Appl. Phys. Lett. · 1986 · 48 · 13310.1063/1.96974 ↗