Measurement of carrier lifetime in materials exhibiting anomalous dispersion
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OpenAlex topics: Semiconductor materials and interfaces · Semiconductor Quantum Structures and Devices · Phase-change materials and chalcogenides
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References (7)
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1. Marshall · Rep. Prog. Phys. · 1982 · 46 · 123510.1088/0034-4885/46/10/002 ↗
2. Marshall · 1989 · 799
3. Hecht · Z. Phys. · 1932 · 77 · 23510.1007/BF01338917 ↗
4. Marshall · Philos. Mag. · 1976 · B54 · 51
5. Pollak · Philos. Mag. · 1977 · 36 · 115710.1080/14786437708239787 ↗
6. Marshall · Philos. Mag. · 1977 · 36 · 35810.1080/14786437708239770 ↗
7. Bayley · Philos. Mag. · 1996 · B23 · 42910.1080/13642819608239127 ↗