journal article·1983-12

Charge trapping in a multilayer ELIC device

K. Kempter, A. Kiendl, W. Müller, H. Voit

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Phase-change materials and chalcogenides · Transition Metal Oxide Nanomaterials · Advanced Semiconductor Detectors and Materials

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References (8)

Show source-provided references
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2. SPIE Appl. Opt. Instr.
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4. Tabak · Phys. Rev. · 1968 · 173 · 89910.1103/PhysRev.173.899 ↗
5. Marshall · Phil. Mag. · 1971 · 24 · 128110.1080/14786437108217413 ↗
6. Street · Phil. Mag. B · 1979 · 38 · 19110.1080/13642817808245675 ↗
7. Electronic Processes in Non-Crystalline Materials
8. Melnyk · J. Non-Cryst. Sol. · 1980 · 35 & 36 · 83710.1016/0022-3093(80)90304-X ↗