Characterization of thin films of amorphous CuxZr1−x using optical and electron spectroscopy
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Copper Interconnects and Reliability · Copper-based nanomaterials and applications · Metallic Glasses and Amorphous Alloys
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (8)
Show source-provided references
1. Rivory · Thin Solid Films · 1982 · 89 · 32310.1016/0040-6090(82)90608-3 ↗
2. Rivory · J. Phys. Lett. · 1981 · 42 · L.48110.1051/jphyslet:019810042022048100 ↗
3. Nevot · Rev. Phys. Appl. · 1980 · 15 · 76110.1051/rphysap:01980001503076100 ↗
4. Cromer · J. Chem. Phys. · 1970 · 53 · 189110.1063/1.1674266 ↗
5. Kiessig · Ann. Phys. (Leipzig) · 1931 · 5 · 71510.1002/andp.19314020607 ↗
6. Umrath · Z. Angew. Phys. · 1967 · 22 · 406
7. Chen · Phys. Stat. Solidi (a) · 1979 · 51 · 59310.1002/pssa.2210510235 ↗
8. Y. Calveyrac, J. P. Chevalier, A. Quivy, M. Harmelin and J. Bigot, Phil. Mag. (to be published).