Low-field current on thin oxides after constant current or radiation stresses
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Research context
OpenAlex topics: Semiconductor materials and devices · Electronic and Structural Properties of Oxides · Advancements in Semiconductor Devices and Circuit Design
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References (10)
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8. T. P. Ma, Paul V. Dressendorfer, Ionizing Radiation Effects in MOS Devices and Circuits, Wiley, New York, 1989
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10. McWhorter · IEEE Trans. Nucl. Sci. · 1990 · 37 · 168210.1109/23.101177 ↗