Structural analysis of amorphous thin films by time of flight mass spectrometry
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Abstract
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Research context
OpenAlex topics: Glass properties and applications · Thin-Film Transistor Technologies · Mineralogy and Gemology Studies
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References (5)
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1. Zachariasen · J. Amer. Chem. Soc. · 1932 · 54 · 384110.1021/ja01349a006 ↗
2. Polk · J. Non-Cryst. Solids · 1971 · 5 · 36510.1016/0022-3093(71)90038-X ↗
3. Menelle · J. Non-Cryst. Solids. · 1985 · 77–78 · 213
4. Hishikawa · Jpn. J. Appl. Phys. · 1985 · 24 · 38510.1143/JJAP.24.385 ↗
5. Muramatsu · Jpn. J. Appl. Phys. · 1989 · 28 · L109210.1143/JJAP.28.L1092 ↗