Time-of-flight and constant-photocurrent measurements in a-Si:S:H alloys
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Thermography and Photoacoustic Techniques · Silicon Nanostructures and Photoluminescence
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (11)
Show source-provided references
1. Aljishi · J. Non-Cryst. Solids · 1989 · 114 · 46210.1016/0022-3093(89)90617-0 ↗
2. Al-Dallal · J. Non-Cryst. Solids · 1989 · 114 · 78910.1016/0022-3093(89)90721-7 ↗
3. Al-Dallal · Philos. Mag. B · 1991 · 63 · 83910.1080/13642819108205541 ↗
4. Lin · Appl. Phys. Lett. · 1990 · 57 · 30010.1063/1.103720 ↗
5. Seynhaeve · Philos. Mag. B · 1988 · 58 · 42110.1080/13642818808218384 ↗
6. Seynhaeve · Phys. Rev. B · 1989 · 39 · 1019610.1103/PhysRevB.39.10196 ↗
7. Nesládek · J. Non-Cryst. Solids · 1992 · 141 · 15510.1016/S0022-3093(05)80529-0 ↗
8. Usala · Appl. Surf. Sc. · 1991 · 50 · 26510.1016/0169-4332(91)90178-M ↗
9. Jensen · Solid State Commun. · 1990 · 11 · 130110.1016/0038-1098(90)90580-5 ↗
10. Kočka · 1988 · vol. A · 297
11. Marshall · Philos. Mag. B · 1987 · 56 · 64110.1080/13642818708220169 ↗