Influence of stoichiometry on the physical properties of microcrystalline-amorphous GaAs films

journal article·1986-06

G. Monnom, C. Paparoditis, Ph. Gaucherel, S. Cavalieri, A. Rideau

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No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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OpenAlex topics: Thin-Film Transistor Technologies · Phase-change materials and chalcogenides · Semiconductor materials and interfaces

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