journal article·1997-08

The influence of quantum effects on the determination of gate oxide thickness from C-V measurements

K. Dmowski, A. Halimaoui

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Semiconductor materials and devices · Silicon and Solar Cell Technologies

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References (13)

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