Measurement of the energy band discontinuities in a-SiC p-i-n junctions by internal photoemission
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OpenAlex topics: Silicon Carbide Semiconductor Technologies · Semiconductor materials and devices · Thin-Film Transistor Technologies
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References (4)
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1. Krunangam · Jpn. J. Appl. Phys. · 1985 · 24 · L. 80610.1143/JJAP.24.L806 ↗
2. Wronski · Appl. Phys. Lett. · 1980 · 37 · 9610.1063/1.91717 ↗
3. Yamamoto · Jpn. J. Appl. Phys. · 1981 · 20 · 18510.7567/JJAPS.20S2.185 ↗
4. Hirose · J. Non-Crystal Solid · 1984 · 66 · 32710.1016/0022-3093(84)90340-5 ↗