Individual electronic defect states in a-Si:H/a-SiNx:H double barrier structures
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OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Thin-Film Transistor Technologies · Semiconductor materials and interfaces
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References (7)
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7. Henry · Phys. Rev. · 1977 · B15 · 98910.1103/PhysRevB.15.989 ↗