Morphological fluctuations in discharge-produced μc-Si:H studied by small angle X-ray scattering
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OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · X-ray Spectroscopy and Fluorescence Analysis
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References (10)
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1. Vepěk · J. Phys. C · 1981 · 14 · 259
2. Usui · J. Non-Cryst. Solids · 1979 · 34 · 110.1016/0022-3093(79)90002-4 ↗
3. Matsuda · Jpn. J. Appl. Phys. · 1980 · 19 · L30510.1143/JJAP.19.L305 ↗
4. Hamasaki · Appl. Phys. Lett. · 1980 · 37 · 108410.1063/1.91872 ↗
5. Mishima · Philos. Mag. · 1982 · 46 · 110.1080/13642818208246419 ↗
6. Vepřek · J. de Phys. · 1981 · C4
7. Guinier · 1955
8. D'Antonio · Phys. Rev. Lett. · 1979 · 43 · 116110.1103/PhysRevLett.43.1161 ↗
9. Shirafuji · Solid St. Commun. · 1983 · 45 · 57710.1016/0038-1098(83)90430-1 ↗
10. Hirose · Jpn. J. Appl. Phys. · 1982 · 21 · 27510.7567/JJAPS.21S1.275 ↗