Infrared ellipsometry study of the vibrational properties of a-Si:H, a-SiC:H and a-SiGe:H ultrathin films
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Abstract
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Research context
OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Silicon and Solar Cell Technologies
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References (11)
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1. Antoine · J. Appl. Phys. · 1987 · 61 · 250110.1063/1.337924 ↗
2. A.M. Antoine and B. Drevillon (This conference).
3. R. Benferhat and B. Drevillon, Thin Solid Films (in press).
4. Drevillon · Rev. Sci. Instrum. · 1982 · 53 · 96910.1063/1.1137118 ↗
5. B. Drevillon and R. Benferhat (to be published).
6. Schimdt · J. Non-Cryst. Solids · 1985 · 77 and 78 · 84910.1016/0022-3093(85)90793-8 ↗
7. Antoine · 1986 · 609
8. Lucovsky · J. Non-Cryst. Solids · 1985 · 76 · 17310.1016/0022-3093(85)90061-4 ↗
9. Lucovsky · Solid State Commun. · 1979 · 29 · 57110.1016/0038-1098(79)90666-5 ↗
10. Wieder · Phys. Stat. Sol. · 1979 · B92 · 9910.1002/pssb.2220920112 ↗
11. Rübel · Phys. Stat. Sol. · 1987 · B139 · 13110.1002/pssb.2221390111 ↗