journal article·1996-05

Comments on space-charge-limited time-of-flight measurements in post-transit mode, applied to a-Si:H based solar cells

A. Fejfar, G. Juška, J. Kočka

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Integrated Circuits and Semiconductor Failure Analysis

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References (13)

Show source-provided references
1. Kočka · J. Non-Cryst. Solids · 1991 · 137–138 · 42710.1016/S0022-3093(05)80146-2 ↗
2. Juška · Phil. Mag. · 1994 · B69 · 27710.1080/01418639408240109 ↗
3. Kočka · J. Non-Cryst. Solids · 1993 · 164–166 · 48910.1016/0022-3093(93)90596-P ↗
4. Seynhave · Phys. Rev. · 1989 · B39 · 1019610.1103/PhysRevB.39.10196 ↗
5. Schauer · Appl. Phys. Lett. · 1994 · 64 · 300910.1063/1.111387 ↗
6. Zapletal · 1994 · 104
7. Juška · 1995 · 343
8. Brüggemann · 1995 · 51
9. Stutzmann · Phys. Rev. · 1987 · B35 · 973510.1103/PhysRevB.35.9735 ↗
10. G. Juška et al. to be published.
11. Kočka · 1994
12. Juška · Phys. Rev. · 1995 · B51
13. Nebel · J. Non-Cryst. Solids · 1989 · 114 · 60010.1016/0022-3093(89)90662-5 ↗