Noise measurements in thin films of amorphous silicon
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Research context
OpenAlex topics: Glass properties and applications · Thin-Film Transistor Technologies · Surface Roughness and Optical Measurements
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References (7)
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1. Mott · 1979
2. Hauser · Phys. Rev. B · 1973 · 8 · 381710.1103/PhysRevB.8.3817 ↗
3. Brodsky · Journal of noncrystalline Solids · 1972 · 10 · 73910.1016/0022-3093(72)90221-9 ↗
4. Chik · Solid State Comm. · 1980 · 33 · 101910.1016/0038-1098(80)90309-9 ↗
5. Nagel · 1979 · 125
6. Hooge · Phys. Lett. · 1969 · 29A · 13910.1016/0375-9601(69)90076-0 ↗
7. Bischop · 1984