journal article·1983-12

Characterization of mobility-lifetime products and interface property in amorphous silicon p-i-n junctions

Hiroaki Okamoto, Hirotsugu Kida, Koji Fukumoto, Shuichi Nonomura, Yoshihiro Hamakawa

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Silicon Carbide Semiconductor Technologies

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References (9)

Show source-provided references
1. Okamoto · Solar Cells · 1983 · 8 · 31710.1016/0379-6787(83)90095-9 ↗
2. Okamoto · J. Appl. Phys. · 1983 · 54 · 323610.1063/1.332485 ↗
3. Tawada · J. Appl. Phys. · 1982 · 53 · 527310.1063/1.331363 ↗
4. S. Nonomura, H. Okamoto and Y. Hamakawa, Appl. Phys. A (in press) and this volume.
5. Oda · Phil. Mag. · 1981 · B6 · 107910.1080/01418638108222575 ↗
6. H. Okamoto, H. Kida and Y. Hamakawa, submitted to Phil. Mag.
7. Dersch · Phys. Stat. Sol. · 1981 · 105 · 26510.1002/pssb.2221050129 ↗
8. Knights · Solid State Comm. · 1977 · 22 · 13310.1016/0038-1098(77)90418-5 ↗
9. S. Nonomura, H. Okamoto, Y. Kashima, Solar Cells (in press) and Y. Kashima, S. Nonomura, H. Okamoto and Y. Hamakawa, this volume.