journal article·1989-12

Safe hole trap conversion properties and microscopic models

T.J. McMahon, R.S. Crandall

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Transition Metal Oxide Nanomaterials

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References (12)

Show source-provided references
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4. Stutzmann · Phys. Rev. · 1985 · B32 · 2310.1103/PhysRevB.32.23 ↗
5. Muller · 1988 · 118 · 285
6. Street · Phys. Rev. · 1989 · B40
7. Adler · J. Phys. Paris · 1981 · 42 · c310.1051/jphyscol:1981401 ↗
8. H.M. Branz and M. Silver, (private communication)
9. McMahon · Phys. Rev. · 1989 · B39 · 176610.1103/PhysRevB.39.1766 ↗
10. T.J. McMahon and R.S. Crandall, P. Mag. (in press)_
11. Jackson · Appl. Phys. Lett. · 1986 · 49 · 95710.1063/1.97494 ↗
12. Bennett · J. Appl. Phys. · 1987 · 62 · 396810.1063/1.339195 ↗