Dynamic stressing of thin tunnel oxides: a way to emulate a single EEPROM cell programming function
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OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Electronic and Structural Properties of Oxides
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References (9)
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4. Runnion · IEEE Trans. Electron Devices · 1997 · 44 · 99310.1109/16.585556 ↗
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6. Rodriguez · IEEE Trans. Electron Devices · 1998 · 45 · 88110.1109/16.662796 ↗
7. Ciappa · Microelectron. Reliability · 1997 · 37 · 152510.1016/S0026-2714(97)00100-5 ↗
8. Lenzlinger · J. Appl. Phys. · 1969 · 40 · 27810.1063/1.1657043 ↗
9. Lanzoni · IEEE Trans. Electron Devices · 1993 · 40 · 95110.1109/16.210204 ↗