journal article·1983-12

X-ray RDF analysis of 1500 Å thick amorphous films

A. Fischer-Colbrie, P.H. Fuoss

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Phase-change materials and chalcogenides · Glass properties and applications · Chalcogenide Semiconductor Thin Films

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (2)

Show source-provided references
1. Marra · J. Appl. Phys. · 1979 · 50 · 627910.1063/1.325845 ↗
2. Fuoss · Phys. Rev. Lett. · 1981 · 46 · 153710.1103/PhysRevLett.46.1537 ↗