journal article·1998-05

Towards a better understanding of surfaces of hydrogenated amorphous silicon: investigation by STM and AFM

J Herion, K Szot, Ch Ross, F Siebke

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Force Microscopy Techniques and Applications · Photonic Crystals and Applications

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References (7)

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4. Herion · Fresenius J. Anal. Chem. · 1997 · 358 · 33810.1007/s002160050423 ↗
5. Horn-von Hoegen · Surf. Sci. · 1995 · 337 · L77710.1016/0039-6028(95)80036-0 ↗
6. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy, Chap. 1.12, Cambridge Univ. Press, 1994.10.1017/CBO9780511524356 ↗
7. Boland · Adv. Phys. · 1993 · 42 · 12910.1080/00018739300101474 ↗